On Thermal Dynamics Embedded Static Voltage Stability Margin
Published in IEEE Transactions on Power Systems, 2023
Recommended citation: S. Lu, Y. Xu, W. Gu, X. Fang and Z. Dong, "On Thermal Dynamics Embedded Static Voltage Stability Margin," in IEEE Transactions on Power Systems, vol. 38, no. 3, pp. 2982-2985, May 2023, doi: 10.1109/TPWRS.2023.3246301. https://ieeexplore.ieee.org/abstract/document/10048558