Mitigate overestimation of voltage stability margin by coupled single-port circuit models
Published in 2016 IEEE Power and Energy Society General Meeting (PESGM), 2016
Recommended citation: H Yuan, X Li, F Li, X Fang, H Cui, Q Hu, "Mitigate overestimation of voltage stability margin by coupled single-port circuit models," 2016 IEEE Power and Energy Society General Meeting (PESGM), 2016. Journal link
